Far-field scattering microscopy applied to analysis of slow light, power enhancement, and delay times in uniform Bragg waveguide gratings
Far-field scattering microscopy applied to analysis of slow light, power enhancement, and delay times in uniform Bragg waveguide gratings
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DOI：
10.1364/oe.15.001851
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发表时间：
2007-02-19
期刊：
影响因子：
3.8
通讯作者：
de Ridder, R. M.
中科院分区：
文献类型：
--
作者：
Hopman, W. C. L.;Hoekstra, H. J. W. M.;de Ridder, R. M.
提出了一种基于瑞利散射观测确定波导光栅群折射率、光强增强和延迟时间的新方法。这种远场散射显微镜（FScM）的方法进行了比较，相移方法和一种方法，该方法使用的透射谱来量化的慢波特性。我们发现一个最小的群速度为0.04c和一个最大的强度增强类似于14.5为1000周期的光栅和一个最大的群延迟类似于80 ps为2000周期的光栅。此外，我们表明，FScM方法可用于显示布洛赫共振的强度分布和调查面外损失。最后，讨论了慢波光栅作为折射率传感器的应用，假设透射检测极限为10（-4），该传感器能够检测最小10（-8）的包层折射率变化。(c)2007年，美国光学学会。
A novel method is presented for determining the group index, intensity enhancement and delay times for waveguide gratings, based on ( Rayleigh) scattering observations. This far-field scattering microscopy ( FScM) method is compared with the phase shift method and a method that uses the transmission spectrum to quantify the slow wave properties. We find a minimum group velocity of 0.04c and a maximum intensity enhancement of similar to 14.5 for a 1000-period grating and a maximum group delay of similar to 80 ps for a 2000-period grating. Furthermore, we show that the FScM method can be used for both displaying the intensity distribution of the Bloch resonances and for investigating out of plane losses. Finally, an application is discussed for the slow-wave grating as index sensor able to detect a minimum cladding index change of 10(-8), assuming a transmission detection limit of 10(-4). (c) 2007 Optical Society of America.