Transition metal oxides as charge injecting layer for admittance spectroscopy
Transition metal oxides as charge injecting layer for admittance spectroscopy
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DOI：
10.1063/1.2936301
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发表时间：
2008-05-26
影响因子：
4
通讯作者：
Kowalsky, W.
中科院分区：
文献类型：
--
作者：
Hoping, M.;Schildknecht, C.;Kowalsky, W.
导纳光谱是测定有机化合物载流子迁移率的一种简单而有力的工具。一个要求是要有一个欧姆接触来进行电荷注入。通过使用氧化钨或氧化钼的薄界面层，我们发现了一种有效地将孔注入有机材料的可能性，其深层最高已占据分子轨道水平低至6.3 eV。这些结果大大扩大了导纳光谱方法的应用范围。测量数据与飞行时间技术得到的数据非常吻合。(C) 2008年美国物理研究所。
Admittance spectroscopy is a simple yet powerful tool to determine the carrier mobility of organic compounds. One requirement is to have an Ohmic contact for charge injection. By employing a thin interfacial layer of tungsten oxide, or molybdenum oxide we have found a possibility to efficiently inject holes into organic materials with a deep highest occupied molecular orbital level down to 6.3 eV. These results considerably enhance the application range of the admittance spectroscopy method. The measured data are in excellent agreement with data obtained by the time-of-flight technique. (C) 2008 American Institute of Physics.