Direct Measurements of Femtosecond Energy Dissipation Processes of Hot Electrons in a Gold Film
Direct Measurements of Femtosecond Energy Dissipation Processes of Hot Electrons in a Gold Film
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金膜中热电子飞秒能量耗散过程的直接测量
DOI：
10.1143/jjap.38.2983
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发表时间：
1999
影响因子：
1.5
通讯作者：
T. Sawada
中科院分区：
文献类型：
--
作者：
A. Hibara;T. Morishita;I. Tsuyumoto;A. Harata;T. Kitamori;T. Sawada
用飞秒时间分辨瞬变反射光栅法测量了超热电子在金薄膜中的能量耗散过程。利用双温度模型和暂态光栅法理论对这一过程进行了分析。结果表明，电子-声子耦合和热扩散过程可以独立进行研究。定量研究了电子-声子耦合因子和导热系数与温度的关系。结果表明，在几皮秒的时间尺度上，超热电子的非热态仍然对耗散过程有贡献。
Energy dissipation processes of hot electrons in a gold thin film were measured by a femtosecond time-resolved transient reflecting grating method. The processes were analyzed using the two-temperature model and the theory of the transient grating method. It was found that the electron-phonon coupling and thermal diffusion processes could be investigated independently. Temperature dependence of the electron-phonon coupling factor and the thermal conductivity was investigated quantitatively. The results suggested that the nonthermal states of hot electrons still contribute to the dissipation processes on time scales of several picoseconds.