Harmful voltage overshoots due to turn-on behaviour of ESD protections during fast transients

Harmful voltage overshoots due to turn-on behaviour of ESD protections during fast transients
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DOI：
10.1109/eosesd.2007.4401774
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发表时间：
2007-12
期刊：
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
影响因子：
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通讯作者：
T. Smedes;N. Guitard
T. Smedes;N. Guitard
中科院分区：
其他
文献类型：
--
作者：
T. Smedes;N. Guitard

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由于器件的反应时间，ESD脉冲的上升时间对保护网络的效率有很大影响。（vf-）TLP显然会根据上升时间导致不同的故障模式。设计能够处理快速ESD瞬变的保护时需要这些知识。
Due to the reaction time of the devices, the rise time of an ESD pulse has a strong effect on the efficiency of a protection network. (vf-)TLP clearly causes different failure modes depending on the rise time. This knowledge is needed to design protections that can handle fast ESD transients.