Characterization of Organic Thin Films
Characterization of Organic Thin Films
复制标题
有机薄膜的表征
DOI：
--
复制
发表时间：
1994
期刊：
影响因子：
--
通讯作者：
Abraham Ulman
中科院分区：
文献类型：
--
作者：
Abraham Ulman
基于有机材料的薄膜是现代技术革命的核心，从先进的电子学到光学传感器到生物医学工程。这卷在“材料表征”系列介绍了主要的常见类型的分析用于表征薄膜和各种适当的表征技术。首先介绍了Langmuir-Blodgett膜和自组装单分子膜等材料，然后分析了表面性质和用于此类的各种表征技术。读者将找到详细的信息：各种光谱方法来表征有机薄膜，包括红外光谱和拉曼光谱X射线衍射技术，高分辨率EELS研究，和X射线光电子能谱;有机薄膜的主要表征技术，包括俄歇电子能谱，动态二次离子质谱和透射电子显微镜（TEM）的简明摘要。
Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the "Materials Characterization" series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. Readers will find detailed information on: various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy; concise summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM).