Analytical description of STED microscopy performance
Analytical description of STED microscopy performance
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DOI：
10.1364/oe.18.026417
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发表时间：
2010-12-06
期刊：
影响因子：
3.8
通讯作者：
Hell, Stefan W.
中科院分区：
文献类型：
--
作者：
Leutenegger, Marcel;Eggeling, Christian;Hell, Stefan W.
受激发射耗尽（STED）通过施加空间调制的光场来解析比远场光学衍射极限更接近的荧光特征，所述空间调制的光场使这些特征中除了一个之外的所有特征连续地保持黑暗。为了估计瞬态荧光团暗化的效率，我们开发了考虑STED光束的时空强度分布的解析方程。这些方程提供了在各种条件下（例如具有不同脉冲持续时间的连续波或脉冲STED光束）要获得的分辨率和对比度的快速分析和优化。特别强调的是荧光波动的方法，如相关光谱（FCS）使用STED。2010美国光学学会Optical Society of America
Stimulated emission depletion (STED) resolves fluorescent features that are closer than the far-field optical diffraction limit by applying a spatially modulated light field keeping all but one of these features dark consecutively. For estimating the efficiency of transient fluorophore darkening, we developed analytical equations considering the spatio-temporal intensity profile of the STED beam. These equations provide a quick analysis and optimization of the resolution and contrast to be gained under various conditions, such as continuous wave or pulsed STED beams having different pulse durations. Particular emphasis is placed on fluorescence fluctuation methods such as correlation spectroscopy (FCS) using STED. (C)2010 Optical Society of America