A unified approach to the analysis of Horton‐Strahler parameters of binary tree structures
A unified approach to the analysis of Horton‐Strahler parameters of binary tree structures
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二叉树结构 Horton-Strahler 参数分析的统一方法
DOI：
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发表时间：
2002
期刊：
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通讯作者：
M. Nebel
中科院分区：
文献类型：
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作者：
M. Nebel
霍顿-斯特拉勒数自然产生于各种领域的问题，例如地质学、分子生物学和计算机科学。因此，对于不同类别的二叉树结构的相关参数的详细调查是有意义的。本文给出了一种可能的方法，即如何对与Horton-Strahler数有关的参数进行统一的数学分析，从而只需一次分析就能得到许多不同树类的结果。并以期望Horton-Strahler数及其相关的三阶矩、平均临界结点数和临界结点间的期望距离为例进行了说明。©2002威利期刊公司随机结构。学报，21：252-277,2002
The Horton‐Strahler number naturally arose from problems in various fields, e.g., geology, molecular biology and computer science. Consequently, detailed investigations of related parameters for different classes of binary tree structures are of interest. This paper shows one possibility of how to perform a mathematical analysis for parameters related to the Horton‐Strahler number in a unified way such that only a single analysis is needed to obtain results for many different classes of trees. The method is explained by the examples of the expected Horton‐Strahler number and the related rth moments, the average number of critical nodes, and the expected distance between critical nodes. © 2002 Wiley Periodicals, Inc. Random Struct. Alg., 21: 252–277, 2002