Testing for Transistor Aging
Testing for Transistor Aging
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晶体管老化测试
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
S. Mitra
中科院分区：
文献类型：
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作者：
A. H. Baba;S. Mitra
晶体管老化会导致电路延迟随时间推移而退化，并且是未来系统日益关注的问题。在线电路故障预测与在线自测试相结合，可以克服具有内置自愈功能的鲁棒系统的晶体管老化挑战。有效的电路故障预测需要非常全面的测试，以估计系统运行期间大型设计中各个部分的老化量。本文介绍了这样的测试技术。大型设计的结果证明了所提出的技术的实用性和有效性。
Transistor aging results in circuit delay degradation over time,and is a growing concern for future systems. On-line circuit failure prediction, together with on-line self-test, can overcome transistor aging challenges for robust systems with built-in self-healing.Effective circuit failure prediction requires very thorough testing to estimate the amount of aging in various parts of a large design during system operation. This paper introduces such testing techniques. Results on large designs demonstrate the practicality and effectiveness of presented techniques.