Electrical detection of confined gap plasmons in metal-insulator-metal waveguides
Electrical detection of confined gap plasmons in metal-insulator-metal waveguides
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DOI：
10.1038/nphoton.2009.47
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发表时间：
2009-05-01
期刊：
影响因子：
35
通讯作者：
Borghs, Gustaaf
中科院分区：
文献类型：
--
作者：
Neutens, Pieter;Van Dorpe, Pol;Borghs, Gustaaf
等离子体激元波导在提供对经典电互连的带宽限制的解决方案方面提供了希望（1-3）。在长距离表面等离子体激元波导中实现了快速、低损耗和无误差的信号传输（4，5）。具有短传播长度的深亚波长等离子体激元波导也已被证明（6，7），显示了匹配光学器件和当今电子元件的尺寸的可能性。然而，为了将联合收割机表面等离子体激元波导与电子电路相结合，需要开发新的高带宽电光换能器。在这里，我们实验证明了金属缝隙波导中表面等离子体激元的电检测。通过集成的金属-半导体-金属光电探测器，检测和表征了金属-绝缘体-金属波导中的高度受限的表面等离子体激元。这种在金属波导中集成电光元件的方法可以导致先进的有源等离子体器件和高带宽片上等离子体电路的发展。
Plasmonic waveguides offer promise in providing a solution to the bandwidth limitations of classical electrical interconnections(1-3). Fast, low-loss and error-free signal transmission has been achieved in long-range surface plasmon polariton waveguides(4,5). Deep subwavelength plasmonic waveguides with short propagation lengths have also been demonstrated(6,7), showing the possibility of matching the sizes of optics and today's electronic components. However, in order to combine surface plasmon waveguides with electronic circuits, new high-bandwidth electro-optical transducers need to be developed. Here, we experimentally demonstrate the electrical detection of surface plasmon polaritons in metallic slot waveguides. By means of an integrated metal-semiconductor-metal photodetector, highly confined surface plasmon polaritons in a metal-insulator-metal waveguide are detected and characterized. This approach of integrating electro-optical components in metallic waveguides could lead to the development of advanced active plasmonic devices and high-bandwidth on-chip plasmonic circuits.