Analysis of temporal masking effect on single-event upset rates for sequential circuits

Analysis of temporal masking effect on single-event upset rates for sequential circuits
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时序电路单事件扰动率的时间掩蔽效应分析

DOI：
10.1109/radecs.2016.8093177
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发表时间：
2016
期刊：
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
影响因子：
--
通讯作者：
B. Bhuva
B. Bhuva
中科院分区：
--
文献类型：
--
作者：
R. M. Chen;Z. Diggins;N. Mahatme;L. Wang;E. Zhang;Y. P. Chen;Y. N. Liu;B. Narasimham;A. Witulski;B. Bhuva

文献摘要

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减少单粒子翻转率时序电路由于时间掩蔽效应进行评估。分析了电源电压、组合逻辑延迟和粒子LET对时序电路单粒子翻转率的影响。
Reduction in single-event upset rates for sequential circuits due to temporal masking effect is evaluated. Effects of supply voltage, combinational-logic delay and particle LET are analyzed for sequential circuits SEU rates.