Magnetic dissipation microscopy in ambient conditions
Magnetic dissipation microscopy in ambient conditions
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环境条件下的磁耗散显微镜
DOI：
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发表时间：
1999
期刊：
影响因子：
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通讯作者：
J. Cleveland
中科院分区：
文献类型：
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作者：
R. Proksch;K. Babcock;J. Cleveland
我们已经量化了亚皮瓦功率损耗非常软（钇铁石榴石）和相对硬（金属蒸发磁带）的铁磁材料与耗散微磁过程中的磁力显微镜成像。我们在空气中工作的1 kHz带宽内的热限制功率分辨率为2×10−15 W。 在外延石榴石薄膜中，峰值耗散（3×10−13 W）与尖端局域场引起的畴壁运动在空间上相关。 在用涂覆有50 nm CoCr的悬臂梁成像的金属蒸发记录带中，在样品的极端局部区域（<10 nm）中观察到耗散。当使用不同的头端时，没有耗散特征表明耗散起源于头端而不是样品。这种技术显示出的承诺映射微磁结构和耗散过程，定量评估磁力显微镜（MFM）的尖端性能，并检测MFM图像中的扰动。
We have quantified sub-picowatt power losses in very soft (yttrium iron garnets) and relatively hard (metal evaporated tape) ferromagnetic materials associated with dissipative micromagnetic processes during magnetic force microscope imaging. We had a thermally limited power resolution of 2×10−15 W in a 1 kHz bandwidth operating in air. In the epitaxial garnet film, peak dissipation (3×10−13 W) was spatially correlated with domain wall motion induced by the localized field from the tip. In metal-evaporated recording tape imaged with a cantilever coated with 50 nm of CoCr, the dissipation was observed in extremely localized regions of the sample (<10 nm). Absence of dissipation features when using a different tip suggests the dissipation originated in the tip rather than the sample. This technique shows promise for mapping micromagnetic structure and dissipative processes, quantitatively evaluating magnetic force microscope (MFM) tip performance, and for detecting perturbations in MFM images.