Rapid Single Flux Quantum T-flip flop operating up to 770 GHz
Rapid Single Flux Quantum T-flip flop operating up to 770 GHz
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DOI:
10.1109/77.783712
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发表时间:
1999-06-01
影响因子:
1.8
通讯作者:
Likharev, KK
中科院分区:
文献类型:
--
作者:
Chen, W;Rylyakov, AV;Likharev, KK
Rapid Single Flux Quantum (RSFQ) T-flip flops (TFFs) operating up to 770 GHz have been demonstrated at 4.2 K The devices, consisting of either resistively shunted or unshunted Josephson junctions, are fabricated using a planarized Nb/AlOx/Nb trilayer process. Electron beam lithography is used to pattern all levels with a minimum junction area less than 0.1 mu m(2). Critical current densities of 0.5 mA/mu m(2) and 2.5 mA/mu m(2) are used for the shunted (tested at 1.8 k) and unshunted devices (tested at 4.2 K) respectively. The input and output frequencies of the TFFs are obtained from the input and output voltages by the Josephson relation. The output voltage is exactly half of the input voltage when the divide-by-two operation is correct.