Mixed-valence vanadium oxides studied by XPS
Mixed-valence vanadium oxides studied by XPS
复制标题
DOI：
10.1016/s0039-6028(00)00111-4
复制
发表时间：
2000-05-20
期刊：
影响因子：
1.9
通讯作者：
Reichelt, W
中科院分区：
文献类型：
--
作者：
Demeter, M;Neumann, M;Reichelt, W
用x射线光电子能谱（XPS）研究了几种混合价钒氧化物单晶。对V2O5、VO2和V2O3进行了大量的研究。较少研究的是混合价化合物，如V3O5， V4O7和V6O13体系，在这里讨论。它们表现为温度金属绝缘体转变（MIT）的函数，给出了这些系统在MIT温度以上和以下的详细分析。并与V2O5、VO2和V2O3分别为V5+、V4+和V3+离子体系的核能级谱进行了比较。所研究的所有氧化物的电子结构都具有强的V - 3d-O - 2p杂化特征，并与类似的研究相联系进行了讨论。(C) 2000 Elsevier Science B.V.版权所有
We have investigated several mixed-valence vanadium oxides, single-crystals by X-ray photoelectron spectroscopy (XPS). Many studies have been performed on V2O5, VO2 and V2O3. Less investigated are the mixed-valence compounds, as the V3O5, V4O7 and V6O13 systems, which are discussed here. They exhibit as a function of temperature metal-insulator transitions (MIT), A detailed analysis for these systems, above and below the MIT temperature is given. The core-level spectra for the mixed-valence compounds are compared with those of the related systems, V2O5, VO2 and V2O3 having V5+, V4+ and V3+ ions, respectively. The electronic structures for all investigated oxides are characterized by strong V 3d-O 2p hybridization and they are discussed in relation with similar studies. (C) 2000 Elsevier Science B.V. All rights reserved.