Measurement of Appearance Potentials of Ions Produced by Electron Impact, using a Mass Spectrometer
Measurement of Appearance Potentials of Ions Produced by Electron Impact, using a Mass Spectrometer
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使用质谱仪测量电子碰撞产生的离子的出现电位
DOI：
10.1038/165810b0
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发表时间：
1950
期刊：
影响因子：
64.8
通讯作者：
J. W. Warren
中科院分区：
文献类型：
--
作者：
J. W. Warren
质谱仪常用于测量电子轰击气体分子所产生的离子的出现电势。为此，两种气体同时进入仪器;一种是被研究的气体，而另一种是“标准气体”（通常是氩气或氪气），其电离电位可以从光谱数据中准确得知。测量作为电子能量的函数的离子束强度，对于需要其出现电势的离子和对于其已知的离子两者。这些测量是在比最初检测到电子束的电位高几伏的范围内进行的。有几种相当任意的方法被用来推导这两种势之间的差别。
THE mass spectrometer is often used for the measurement of the appearance potentials of ions produced by electron bombardment of gaseous molecules. For this purpose, two gases are admitted to the instrument simultaneously; one is the gas under investigation, while the other is a ‘standard gas’ (usually argon or krypton), the ionization potential of which is accurately known from spectroscopic data. Measurements are made of the ion beam intensities as a function of electron energy, both for the ion the appearance potential of which is required and for that for which it is known. These measurements are made over a range of a few volts above the potentials at which the beams are first detected. Several rather arbitrary methods have been used for deducing the difference between the two potentials1.