High speed atomic force microscopy enabled by a sample profile estimator
High speed atomic force microscopy enabled by a sample profile estimator
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DOI：
10.1063/1.4808211
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发表时间：
2013-05-27
影响因子：
4
通讯作者：
Andersson, Sean B.
中科院分区：
文献类型：
--
作者：
Huang, Peng;Andersson, Sean B.
在本文中，原子力显微镜（AFM）成像的估计方案，提出了产生的成像速率远远超出带宽的垂直定位器，并允许高速原子力显微镜上的一个典型的商业仪器。该估计器可以应用于现有的仪器，除了采样悬臂信号所需的硬件修改之外，几乎没有硬件修改。校准样品以及λ DNA的实验进行说明这种方法的有效性。这些显示了成像速率的一个数量级以上的改善。(C)2013 AIP Publishing LLC.
In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with little to no hardware modification other than that needed to sample the cantilever signal. Experiments on a calibration sample as well as lambda DNA are performed to illustrate the effectiveness of this method. These show a greater than an order-of-magnitude improvement in the imaging rate. (C) 2013 AIP Publishing LLC.