A novel lateral bipolar transistor with 67 GHz fmax on thin-film SOI for RF analog applications
A novel lateral bipolar transistor with 67 GHz fmax on thin-film SOI for RF analog applications
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DOI:
10.1109/16.848304
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发表时间:
2000-07-01
影响因子:
3.1
通讯作者:
Katsumata, Y
中科院分区:
文献类型:
--
作者:
Nii, H;Yamada, T;Katsumata, Y
In this paper, a novel lateral bipolar transistor on thin film silicon-on-insulator (SOI) is presented. With a small emitter size of 0.12 x 3.0 mu m(2),low base resistance of 270 Omega due to a novel Co silicided base electrode and low base-collector parasitic capacitances of 1.4 fF due to SOI material achieve the highest f(max) of 67 GHz among the SOI bipolar transistors. Also, the low emitter-base capacitance of 1.5 fF and the low collector-substrate capacitance of 2.5 fF are realized. The transistor has a simple structure, which is fabricated with simplified processes without any new sophisticated technologies, ex. trench isolation and epitaxial base used in current bipolar transistors. This can lower the fabrication cost of transistors. We have demonstrated the possibility of lateral bipolar transistor on thin film SOI as next-generation device for RF analog applications.