A GRAIN-BOUNDARY DEFECT MODEL FOR INSTABILITY STABILITY OF A ZNO VARISTOR
A GRAIN-BOUNDARY DEFECT MODEL FOR INSTABILITY STABILITY OF A ZNO VARISTOR
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DOI：
10.1007/bf01113755
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发表时间：
1985-01-01
影响因子：
4.5
通讯作者：
CARLSON, WG
中科院分区：
文献类型：
--
作者：
GUPTA, TK;CARLSON, WG
提出了晶界势垒的缺陷模型来解释ZnO压敏电阻器的电压不稳定/稳定现象。所提出的模型的关键元素是锌的杂质，这是存在于耗尽层中的过量锌，所产生的非化学计量性质的ZnO。不稳定性和稳定性都被描述为这些杂质在耗尽层中的扩散，然后在晶界界面处与缺陷发生化学相互作用。最后，大量的实验数据，间接验证所提出的缺陷模型。
A defect model for the grain-boundary barrier has been proposed to explain the phenomena of voltage instability/stability of the ZnO varistor. The key element of the proposed model is the zinc interstitials which are present in the depletion layer as excess zinc, arising from the non-stoichiometric nature of ZnO. Both instability and stability have been described in terms of diffusion of these interstitials in the depletion layer, followed by chemical interactions with defects at the grain-boundary interface. Finally, a large body of experimental data is presented to indirectly validate the proposed defect model.