Recombination and scintillation processes in
Recombination and scintillation processes in
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重组和闪烁过程
DOI：
10.1088/0953-8984/10/37/025
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发表时间：
1998
期刊：
影响因子：
--
通讯作者：
C. Brecher
中科院分区：
文献类型：
--
作者：
A. Wojtowicz;J. Glodo;A. Lempicki;C. Brecher
本文报道了光谱和闪烁的研究，以及建立闪烁体材料。发光发射和激发光谱的标准测量伴随着宽温度范围内的热释光和闪烁光产额的研究，以及各种温度下脉冲伽马和VUV激发下的衰变测量。这些测量解释的框架中的模型，包括一个复合中心和一些电子陷阱。我们证明，一些不寻常的和很大程度上无法解释的功能的闪烁体，如闪烁和辐射衰变时间之间的巨大差距，闪烁衰变中的缓慢组件的存在下，和闪烁光产率的强烈的温度变化之间的150和300 K，有其起源的过程中的电荷载流子捕获和发射的电子陷阱。虽然这些陷阱的性质仍然难以捉摸，大多数的陷阱参数，如频率因子，能量深度和相对人口，已估计。这使得可以预测无陷阱材料的特性，从而可以实现潜在的改进。
This paper reports spectroscopic and scintillation studies of the well established scintillator material . Standard measurements of luminescence emission and excitation spectra have been accompanied by investigations of thermoluminescence and scintillation light yield over a wide temperature range, and by decay measurements under pulsed gamma and VUV excitations at various temperatures. These measurements are interpreted in the framework of a model that includes a recombination centre and a number of electron traps. We demonstrate that some unusual and largely unexplained features of the scintillator, such as a substantial disparity between scintillation and radiative decay times, the presence of slow components in scintillation decays, and a strong temperature variation of scintillation light yield between 150 and 300 K, have their origin in the processes of charge carrier capture and emission by electron traps. Although the nature of these traps remains elusive, most of the trap parameters, such as frequency factors, energy depths, and relative populations, have been estimated. This makes it possible to predict the characteristics of trap-free material and thereby the potential improvements that could be achieved.