Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
复制标题
DOI：
10.1088/1367-2630/12/3/035013
复制
发表时间：
2010-03-31
影响因子：
3.3
通讯作者：
Robinson, I. K.
中科院分区：
文献类型：
--
作者：
Favre-Nicolin, V.;Mastropietro, F.;Robinson, I. K.
布拉格反射相干衍射成像 (CDI) 是研究纳米结构三维 (3D) 成分和应变场的一项有前途的技术，可以直接从单个物体上记录的相干衍射数据中恢复。在本文中，我们报告了直径小于 100 nm 的单一同质和异质纳米线所获得的结果，为此我们使用 CDI 来检索有关这些线中存在的变形和故障的信息。我们还讨论了堆垛层错的影响，堆垛层错可能在纳米线形状和变形的重建过程中产生伪影。
Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.