Charged Particle-Induced Surface Reactions of Organometallic Complexes as a Guide to Precursor Design for Electron- and Ion-Induced Deposition of Nanostructures
Charged Particle-Induced Surface Reactions of Organometallic Complexes as a Guide to Precursor Design for Electron- and Ion-Induced Deposition of Nanostructures
复制标题
带电粒子诱导的有机金属配合物表面反应作为电子和离子诱导纳米结构沉积前驱体设计的指南
DOI:
10.1021/acsami.1c12327
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发表时间:
2021
影响因子:
9.5
通讯作者:
McElwee-White, Lisa
中科院分区:
文献类型:
--
作者:
Yu, Jo-Chi;Abdel-Rahman, Mohammed K.;Fairbrother, D. Howard;McElwee-White, Lisa
Focused electron beam-induced deposition (FEBID) and focused ion beam-induced deposition (FIBID) are direct-write fabrication techniques that use focused beams of charged particles (electrons or ions) to create 3D metal-containing nanostructures by decomposing organometallic precursors onto substrates in a low-pressure environment. For many applications, it is important to minimize contamination of these nanostructures by impurities from incomplete ligand dissociation and desorption. This spotlight on applications describes the use of ultra high vacuum surface science studies to obtain mechanistic information on electron- and ion-induced processes in organometallic precursor candidates. The results are used for the mechanism-based design of custom precursors for FEBID and FIBID.