Edge detection based multi-material interface extraction on industrial CT volumes

Edge detection based multi-material interface extraction on industrial CT volumes
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DOI:
10.1007/s11432-013-4987-2
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发表时间:
2013-09-01
影响因子:
8.8
通讯作者:
Suzuki, Hiromasa
Suzuki, Hiromasa
中科院分区:
计算机科学2区
文献类型:
--
作者:
Ohtake, Yutaka;Suzuki, Hiromasa

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X射线CT扫描最近正成为工业应用和医疗应用的流行技术。由于几何精度对于工业应用通常是重要的,因此需要用于处理CT体积的更精确的方法。本文提出了一种工业CT扫描仪获得的CT体上的多材料界面提取方法。而不是提取等值面,我们检测的边缘点,在那里的体积梯度的范数在梯度方向上取局部最大值,然后插值点的复合隐函数的零级所表示的材料接口。为了实现一个强大的材料识别,多标签图切割在我们的方法中使用。利用边缘点,可以减少CT扫描伪影带来的误差。
X-ray CT scanning is recently becoming a popular technology for industrial applications as well as medical ones. Since the geometrical accuracy is often important for industrial applications, more precise methods for processing CT volumes are required. This paper proposes a method for extracting the multi-material interfaces on CT volumes obtained by industrial CT scanners. Instead of extracting isosurfaces we detect edge-points, at which the norm of the volume gradient takes a local maximum in the gradient direction, and then interpolate the points as the material interfaces represented by the zero-level of compounded implicit functions. In order to achieve a robust material-identification, multilabel graph-cut is utilized in our method. Using edge-points, we can reduce the inaccuracy caused by CT scanning artifacts.