In situ field emission of density-controlled ZnO nanowire arrays
In situ field emission of density-controlled ZnO nanowire arrays
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DOI：
10.1002/adma.200602467
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发表时间：
2007-06-18
影响因子：
29.4
通讯作者：
Wang, Zhong L.
中科院分区：
文献类型：
--
作者：
Wang, Xudong;Zhou, Jun;Wang, Zhong L.
研制了一种有效的现场场发射测量系统，通过在扫描电子显微镜室中设置第二级，可以精确测量和精细控制发射源和对电极之间的距离。发现密度在60和80 μ m（-2）之间的纳米线（见图）和约100 μ m（-2）的纳米线。1 μ m的长度给出最高的发射电流密度。
An effective in situ field-emission measurement system, in which the distance between the emitting source and counter electrode can be accurately measured and finely controlled by setting up a second stage inside a scanning electron microscopy chamber, is developed. It is found that nanowires with a density between 60 and 80 mu m(-2) (see figure) and of ca. 1 mu m in length give the highest emitting current density.