Lead shielding for electrons.
Lead shielding for electrons.
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电子的铅屏蔽。
DOI：
10.1118/1.594841
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发表时间：
1981
期刊：
影响因子：
3.8
通讯作者：
DeibelJr,FC
中科院分区：
文献类型：
--
作者：
Khan,FM;Werner,BL;DeibelJr,FC
以13mev电子束为例，测量了不同厚度铅的透射曲线。数据表明，屏蔽厚度的选择在很大程度上取决于测量的深度。讨论了该参考深度的重要性以及在要求最小厚度的屏蔽设计时的准则。
Using a 13 MeV electron beam as an example, transmission curves for various thicknesses of lead were measured. The data indicated that the choice of shielding thickness depends greatly on the depth at which the measurements are made. The importance of this reference depth and criteria for shield design when shields of minimum thickness are required is discussed.