Measurement-Based Method to Characterize Parasitic Parameters of the Integrated Power Electronics Modules
Measurement-Based Method to Characterize Parasitic Parameters of the Integrated Power Electronics Modules
复制标题
基于测量的方法来表征集成电力电子模块的寄生参数
DOI：
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发表时间：
2007
影响因子：
6.7
通讯作者：
W. Odendaal
中科院分区：
文献类型：
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作者：
Liyu Yang;W. Odendaal
提出了一种基于测量的有源电力电子模块寄生参数提取方法。利用这种方法可以在不破坏结构的情况下提取IPEM内部的寄生电感和电容。线性化模型由阻抗测量导出，从低频到高达100 MHz的频率都有效。提取的参数进行了比较，从商业软件，结果是在良好的协议。提出了一种表征共模电容的并联谐振方法
A measurement-based method for extracting the parasitic parameters of active power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without destroying the structure. The linearized model is derived from impedance measurement and it is valid from low frequency to frequencies as high as 100 MHz. Extracted parameters are compared to those from commercial software and the results are in good agreement. A parallel resonance method is proposed for the characterization of common-mode capacitances