Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences

Simultaneous co-localized super-resolution fluorescence microscopy and atomic force microscopy: combined SIM and AFM platform for the life sciences
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DOI:
10.1038/s41598-020-57885-z
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发表时间:
2020-01-24
期刊:
影响因子:
4.6
通讯作者:
De Beule, Pieter A. A.
De Beule, Pieter A. A.
中科院分区:
综合性期刊3区
文献类型:
--
作者:
Gomez-Varela, Ana I.;Stamov, Dimitar R.;De Beule, Pieter A. A.

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