Neutron scattering studies of BiFeO3 multiferroics: a review for microscopists

Neutron scattering studies of BiFeO3 multiferroics: a review for microscopists
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DOI:
10.1111/j.1365-2818.2009.03227.x
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发表时间:
2009-11
影响因子:
2
通讯作者:
I. Sosnowska
I. Sosnowska
中科院分区:
工程技术4区
文献类型:
--
作者:
I. Sosnowska

文献摘要

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介绍了中子散射技术在多铁性BiFeO_3晶体和磁性研究中的应用。中子散射技术的关键作用,补充X射线衍射方法和透射电子显微镜,显示。重点介绍了Sosnowska等人利用超高分辨飞行时间中子衍射技术检测磁旋轮线有序度的方法及其在BiFeO3及其合金物理性质研究中的作用。第一非弹性中子散射图案的磁激发BiFeO 3也提出。不同的显微镜技术,如透射电子显微镜(TEM),扫描电子显微镜(SEM),场发射TEM和SEM(FESEM和FETEM),磁力显微镜(MFM)和极化力显微镜(PFM)的应用带来洞察铁电性的基本问题,并确认BiFeO3多铁性材料的纳米器件的潜力。
Application of the neutron scattering technique in the study of crystal and magnetic properties of multiferroic BiFeO3 is presented. The crucial role of the neutron scattering technique, complementary to X‐ray diffraction method and transmission electron microscopy, is shown. Especially the ultra high‐resolution time‐of‐flight (TOF) neutron diffraction technique used by Sosnowska et al. to detect the magnetic cycloid ordering and its role in studies of physical properties of BiFeO3 and its alloys are reviewed. The first inelastic neutron scattering patterns of magnetic excitations in BiFeO3 are also presented. Applications of different microscopy techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), field emission TEM and SEM (FESEM and FETEM), magnetic force microscope (MFM) and polarization force microscopy (PFM) bring insight on the fundamental problem of ferroelectricity and confirm the potential of BiFeO3 multiferroic material for nanoscale devices.