Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis
Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis
复制标题
利用能量色散同步加速器衍射的特征进行高级残余应力和纹理分析
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
M. Klaus
中科院分区：
文献类型：
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作者：
C. Genzel;I. Denks;R. Coelho;D. Thomas;R. Mainz;D. Apel;M. Klaus
为了响应材料科学界对残余应力、织构和微观结构分析日益增长的兴趣，人们做出了巨大努力来增强现有的方法并开发新的方法，这些方法允许在高温下进行快速原位研究，在外部载荷或残余应变下进行测量，以及具有高空间分辨率的应力扫描。在本文中，使用高能白色同步辐射的能量色散衍射显示出在残余应力和织构分析方面提供了一些明显的优势，这主要是因为能量色散衍射模式允许在固定但任意散射角2θ下测量完整的衍射图案。一个新的双探测器设置，同时在和出平面衍射分析，这已投入运作最近在能量色散材料科学光束线EDDI在BESSY II，介绍了使用的例子，真实空间的残余应力和织构深度剖析机械处理的多晶材料，以及在高温下的薄膜（残余）应力演化的原位研究。它将被证明，个人的测量问题，需要应用不同的几何狭缝配置，以定义的衍射光束的路径。
Responding to a growing interest from the materials science community for residual stress, texture, and microstructure analysis, strong efforts are made to enhance existing and develop novel methods that allow for fast in-situ studies at elevated temperature, measurements under external load, or residual strain, and stress scanning with high spatial resolution. In the paper, energy-dispersive diffraction using high-energy white synchrotron radiation is shown to provide some distinct advantages concerning residual stress and texture analysis, which mainly arise from the fact that the energy-dispersive diffraction mode allows for the measurement of complete diffraction patterns under fixed but arbitrary scattering angles, 2θ. A new two-detector set-up for simultaneous in- and out-of-plane diffraction analysis, which has been put into operation recently at the energy-dispersive materials science beamline EDDI at BESSY II, is introduced by using the examples of real-space residual stress and texture depth profiling on mechanically treated polycrystalline materials as well as of the in-situ study of (residual) stress evolution in a thin film at elevated temperature. It will be demonstrated that the individual measuring problems require the application of different geometrical slit configurations to define the pathways of the diffracted beams.