HOM PARAMETERS SIMULATION AND MEASUREMENT RESULT OF IHEP02 LOW-LOSS CAVITY
HOM PARAMETERS SIMULATION AND MEASUREMENT RESULT OF IHEP02 LOW-LOSS CAVITY
复制标题
IHEP02低损耗腔HOM参数仿真及测量结果
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
T.X.Zhao
中科院分区：
文献类型：
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作者：
H.J.Zheng;J.Gao;S.Jin;Y.Liu;Z.C.Liu;Z.H.Mi;J.Y.Zhai;T.X.Zhao
在腔内，不仅存在用于加速光束的基模，还存在高阶模（HOM）。光束激发的高阶模会严重影响光束质量，特别是对于较高的R/Q模。本文报告了 IHEP02 低损耗 SRF 腔中高阶模式的最新测量结果。采用不同的方法，得到了危险模式通带的Qext。结果与 TESLA 结果进行了比较。 CST也得到了前三个通带的R/Q，并与TESLA腔的结果进行了比较。
In cavities, there exists not only the fundamental mode which is used to accelerate the beam but also higher order modes (HOMs). The higher order modes excited by beam can seriously affect beam quality, especially for the higher R/Q mode. This paper reports on recent measured results of higher order modes in the IHEP02 low-loss SRF cavity. Using different methods, the Qext of the dangerous modes passbands have been got. The results are compared with TESLA results. R/Q of the first three passbands have also been got by CST and compared with the results of TESLA cavity.