X-ray diffraction strain analysis of a single axial InAs 1-x Px nanowire segment.
X-ray diffraction strain analysis of a single axial InAs 1-x Px nanowire segment.
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DOI：
10.1107/s160057751402284x
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发表时间：
2015-01
影响因子：
2.5
通讯作者：
Stangl J
中科院分区：
文献类型：
--
作者：
Keplinger M;Mandl B;Kriegner D;Holý V;Samuelsson L;Bauer G;Deppert K;Stangl J
采用纳米聚焦X射线衍射法对InAs纳米线中InAs1-xPx异质结轴向段进行了应变分析。利用纳米聚焦X射线衍射仪分析了InAs纳米线中单个轴向InAs1-xPx异质结节段及其周围的空间应变分布。结合有限元模拟，得到了纳米线非均匀应变状态的详细定量图像。这使得人们能够详细了解纳米线和异质段尺寸的变化如何影响其核心区和纳米线侧面附近区域的应变。此外，利用系综平均高分辨率衍射实验确定了纤锌矿和闪锌矿晶体多型体在纳米线中分布的统计信息。
Strain analysis of an axial InAs1–xPx hetero-segment in an InAs nanowire using nano-focused X-ray diffraction is presented. The spatial strain distribution in and around a single axial InAs1–xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire’s inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire’s and hetero-segment’s dimensions affect the strain in its core region and in the region close to the nanowire’s side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.