The thickness and voltage dependent interfacial relaxation process in an ITO/Polyimide/C60/Al double-layer device investigated by time-resolved second harmonic generation

The thickness and voltage dependent interfacial relaxation process in an ITO/Polyimide/C60/Al double-layer device investigated by time-resolved second harmonic generation
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通过时间分辨二次谐波产生研究 ITO/聚酰亚胺/C60/Al 双层器件中厚度和电压相关的界面弛豫过程

DOI:
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发表时间:
2011
期刊:
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通讯作者:
Mitsumasa Iwamoto
Mitsumasa Iwamoto
中科院分区:
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文献类型:
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作者:
Le Zhang;Dai Taguchi;Jun Li;Takaaki Manaka;Mitsumasa Iwamoto

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