Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy
Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy
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DOI：
10.1007/s12213-018-0108-z
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发表时间：
2018-06
影响因子：
2.3
通讯作者：
O. Haenssler;M. F. Wieghaus-;A. Kostopoulos;G. Doundoulakis;E. Aperathitis;S. Fatikow;G. Kiriakidis
中科院分区：
文献类型：
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作者：
O. Haenssler;M. F. Wieghaus-;A. Kostopoulos;G. Doundoulakis;E. Aperathitis;S. Fatikow;G. Kiriakidis
我们报告了适用于不同微观模态的测试标准的测量结果。这些发现是通过多模态混合显微镜获得的，它需要各种校准方法，也需要在纳米机器人环境中作为工具进一步使用。基于FPGA（现场可编程门阵列）的扫描探针显微镜（SPM）控制器实现了原子力和微波微观模式的亚微米成像。它嵌入在纳米机器人和自动化的开源软件框架中，并在本报告中进行了描述。
We report on measurement results of a test standard suitable for different microscopic modalities. These findings were obtained by a multimodal hybrid microscope, which requires various calibration methods, also in terms of its further use as a tool in a nanorobotic environment. A Scanning Probe Microscopy (SPM)-Controller based on an FPGA (Field Programmable Gate Array) enables the submicrometer imaging for atomic force and microwave microscopic modalities. It is embedded in an open source software framework for nanorobotics and -automation and is described in this report.