Characterization of the interface in rubber/silica composite materials
Characterization of the interface in rubber/silica composite materials
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DOI：
10.1002/sia.1463
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发表时间：
2002-10-01
影响因子：
1.7
通讯作者：
Intermite, L
中科院分区：
文献类型：
--
作者：
Salvi, AM;Pucciariello, R;Intermite, L
在橡胶工业，特别是轮胎生产中，最广泛使用的弹性体是苯乙烯-丁二烯橡胶（SBR），其中苯乙烯单元的含量一般为25重量％。单元重复沿大分子链随机分布，丁二烯单元的构型大多为1,4-反式。弹性体共混物与填料混合，充当增强剂，二氧化硅颗粒对其物理和机械性能的影响现已得到充分证实。决定此类复合材料性能的最重要参数之一是橡胶/二氧化硅界面的粘合程度。在这种情况下，通过光谱研究（XPS/x 射线诱导俄歇电子能谱）进行界面表征，以便从核心层和俄歇线化学位移中获取信息。通过详细的曲线拟合程序对一系列复合橡胶进行了检查，该程序可以确定与每个光峰相关的内在和外在结构，并将光谱结果与参考化合物进行比较。聚合物的C 1s 线形和震动区域的变化以及硅、氧和硫核线结合能的降低为界面反应提供了明确的证据。此外，硅的俄歇参数显示出系统性的变化，可以在化学状态图上根据初始和最终状态的贡献进行解释，并用于局部化学环境的理论研究。版权所有 (C) 2002 John Wiley Sons, Ltd.
in the rubber industry, especially tyre production, the most widely used elastomer is styrene-butadiene rubber (SBR) in which the styrene units generally are present at 25 wt.%. The unit repeats are random distributed along the macromolecular chains and the configuration of the butadiene units is mostly 1,4-trans. The elastomer blends are mixed with fillers, acting as reinforcing agents, and the effect that silica particles have on their physical and mechanical properties is now well established. One of the most important parameters in determining the performance of such composite materials is the degree of adhesion at the rubber/silica interface. In this context, the interface characterization has been performed through a spectroscopic investigation (XPS/x-ray-induced Auger electron spectroscopy) in order to derive information from core-level and Auger line chemical shifts. A series of composite rubbers have been examined by means of a detailed curve-fitting procedure that allows the determination of intrinsic and extrinsic structures connected to each photopeak and the spectroscopic results compared with those of reference compounds. The changes in the C 1s lineshape and shake-up region of the polymers and the reduced binding energies of silicon, oxygen and sulphur core lines have provided clear evidence of interfacial reactions. Moreover, the Auger parameters of silicon show systematic shifts that can be interpreted on a chemical state plot in terms of initial- and final-state contributions and used for theoretical investigation of the local chemical environment. Copyright (C) 2002 John Wiley Sons, Ltd.