Nanoscale Elemental Mapping of Intact Solid–Liquid Interfaces and Reactive Materials in Energy Devices Enabled by Cryo-FIB/SEM
Nanoscale Elemental Mapping of Intact Solid–Liquid Interfaces and Reactive Materials in Energy Devices Enabled by Cryo-FIB/SEM
复制标题
通过 Cryo-FIB/SEM 实现能源设备中完整固液界面和反应材料的纳米级元素测绘
DOI：
10.1021/acsenergylett.0c00202
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发表时间：
2020
影响因子：
22
通讯作者：
Kourkoutis, Lena F.
中科院分区：
文献类型：
--
作者：
Zachman, Michael J.;Tu, Zhengyuan;Archer, Lynden A.;Kourkoutis, Lena F.
许多现代能源设备的运行和性能都依赖于固液界面、高反应性材料或两者兼而有之。表征此类材料的困难意味着这些设备通常缺乏在未改变状态下的高分辨率表征。在这里，我们展示了低温样品制备和转移如何通过在制备和表征的所有阶段保持其完整性，将 FIB/SEM 技术的功能扩展到能源设备常见的固液界面和反应材料。我们还展示了冷冻 FIB/SEM 如何与能量色散 X 射线光谱相结合，对这些材料中产生的横截面进行纳米级元素测绘，并讨论了实现最佳结果的策略。最后，我们考虑了该技术当前的局限性，并提出了可以增强其功能的未来发展。我们的结果表明，冷冻 FIB/SEM 对于固液界面或反应材料发挥重要作用且迄今为止无法以高分辨率进行表征的领域将是一种有用的技术。
Many modern energy devices rely on solid–liquid interfaces, highly reactive materials, or both, for their operation and performance. The difficulty of characterizing such materials means these devices often lack high-resolution characterization in an unaltered state. Here, we demonstrate how cryogenic sample preparation and transfer can extend the capabilities of FIB/SEM techniques to solid–liquid interfaces and reactive materials common to energy devices by preserving their integrity through all stages of preparation and characterization. We additionally show how cryo-FIB/SEM paired with energy dispersive X-ray spectroscopy enables nanoscale elemental mapping of cross-sections produced in these materials and discuss strategies to achieve optimal results. Finally, we consider current limitations of the technique and propose future developments that could enhance its capabilities. Our results illustrate that cryo-FIB/SEM will be a useful technique for fields where solid–liquid interfaces or reactive materials play an important role and could, thus far, not be characterized at high resolution.