Flyability and Durability Test of Dynamic Fly-Height Sliders at 1-nm Clearance
Flyability and Durability Test of Dynamic Fly-Height Sliders at 1-nm Clearance
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DOI：
10.1080/10402000903125360
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发表时间：
2010-01-01
影响因子：
2.1
通讯作者：
Meng, Yonggang
中科院分区：
文献类型：
--
作者：
Li, Ning;Zheng, Lanshi;Meng, Yonggang
对硬盘驱动器中更高存储密度的要求正在推动磁头到介质间距（HMS）变得越来越小。目前，由动态飞行高度（DFH）滑块中的加热元件实现的换能器处的热突出可用于通过施加可控电功率来控制HMS。因此，使用DFH技术，滑块可以稳定可靠地飞多低是硬盘驱动器行业的主要关注点。本文介绍了一个测试评估飞行性和耐久性的头-盘接口（HDI）在所需的和超小的间隙使用DFH滑块。通过这样的测试，HDI的飞行能力和耐久性在1纳米的间隙进行了检查，使用商业DFH滑块与两个专门设计的空气轴承表面（ABS）。在周围环境中证明了优化的DFH滑块在1 nm间隙下稳定和耐用的在轨飞行的可能性。
The requirement of higher storage density in hard disk drives is pushing the head-to-media spacing(HMS) to become ever smaller. Currently, thermal protrusion at the transducer that is realized by the heating element in dynamic fly-height(DFH) sliders can be used to control the HMS by applying controllable electrical power. Thus, just how low the slider can fly stably and reliably using the DFH technology is a major concern for the hard-drive industry. This article describes a test for evaluating the flyability and durability of the head-disk interface(HDI) at desired and ultrasmall clearance using DFH sliders. Through such a test, the HDI flyability and durability at 1-nm clearance were examined using commercial DFH sliders with two specially designed air-bearing surfaces(ABSs). The possibility of stable and durable on-track flying at 1-nm clearance for optimized DFH sliders was demonstrated in an ambient environment.