Enhancement of Fluorescent Intensity of a SiO2 : Sm Glass by Al Codoping and Local Structure around Sm by an EXAFS Study
Enhancement of Fluorescent Intensity of a SiO2 : Sm Glass by Al Codoping and Local Structure around Sm by an EXAFS Study
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通过 EXAFS 研究通过 Al 共掺杂增强 SiO2:Sm 玻璃的荧光强度和 Sm 周围的局部结构
DOI：
10.1149/1.2086939
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发表时间：
1990
影响因子：
3.9
通讯作者：
H. Namikawa
中科院分区：
文献类型：
--
作者：
R. Morimo;T. Mizushima;Y. Udagawa;N. Kakuta;A. Ueno;H. Okumura;H. Namikawa
Al离子的加入使Sm离子的发光强度增加了一个数量级以上。EXAFS研究表明，Sm掺杂前后的荧光粉中Sm离子周围的局域结构有很大的不同，在SiO2：Sm荧光粉中，Sm原子在低浓度时分散良好，在高浓度时团聚，而在Al共掺杂的荧光粉中，Sm原子通过Sm-O-Al键与Al配位.这提供了共掺杂剂作用的直接结构证据
An addition of Al ions is found to increase emission intensity form Sm ion more than an order of magnitude. EXAFS study revealed that local structures around Sm ions in the phosphors with and without dopant are significantly different; in the SiO 2 : Sm phosphor Sm atoms are well dispersed at low Sm concentrations and Sm atoms agglomerate at high concentrations, while in the Al codoped phosphor Sm atoms are coordinated by Al through Sm-O-Al bonding. This provides a direct structural evidence of the role of the codopant