Observation of impurities in ice

Observation of impurities in ice
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观察冰中的杂质

DOI:
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发表时间:
2001
期刊:
Microscopy research and technique (Print)
影响因子:
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通讯作者:
I. Baker
I. Baker
中科院分区:
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文献类型:
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作者:
D. Cullen;I. Baker

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本文提出了一种确定多晶冰中杂质微观结构位置的新方法,该方法包括使冰在真空下升华,然后在低真空扫描电子显微镜中使用能量色散X射线显微分析来识别浓缩的杂质。该方法允许观察天然多晶冰的晶界和晶格中杂质的存在。使用这种技术对天然冰,主要由NaCl组成的细丝被观察到在一些晶界,少量的硫和氯被发现在冰的晶粒内部,和大浓度的硫被观察到的夹杂物。Microsc. Res. Tech. 55:198-207,2001.© 2001 Wiley利斯公司
This paper presents a new method for determining the microstructural location of impurities in polycrystalline ice, which involves allowing the ice to sublimate under vacuum and then identifying the concentrated impurities using energy dispersive X‐ray microanalysis in a low‐vacuum scanning electron microscope. The method allows the presence of impurities in both the grain boundaries and the lattice of natural polycrystalline ice to be observed. Using this technique on natural ice, filaments consisting chiefly of NaCl were observed in some grain boundaries, small amounts of sulfur and chlorine were found in the grain interiors of the ice, and large concentrations of sulfur were observed in inclusions. Microsc. Res. Tech. 55:198–207, 2001. © 2001 Wiley‐Liss, Inc.