Modifications to the synthetic aperture microwave imaging diagnostic.
Modifications to the synthetic aperture microwave imaging diagnostic.
复制标题
DOI：
10.1063/1.4961283
复制
发表时间：
2016-11
期刊：
影响因子：
--
通讯作者：
K. Brunner;J. Chorley;N. Dipper;G. Naylor;R. Sharples;G. Taylor;D. Thomas;R. Vann
中科院分区：
文献类型：
--
作者：
K. Brunner;J. Chorley;N. Dipper;G. Naylor;R. Sharples;G. Taylor;D. Thomas;R. Vann
合成孔径微波成像诊断自2011年开始在MAST实验上运行。首次提供了B-X-O模式转换窗口的二维图像，证明了进行二维多普勒后向散射实验的可行性。诊断在很大程度上依赖于现场可编程门阵列来进行其工作。最近的成功和新获得的诊断经验使我们对其进行了修改。这些增强功能将实现俯仰角轮廓测量、O和X模式分离以及2D DBS数据的连续采集。该诊断也已安装在NSTX-U上，并自2016年5月起开始采集数据。
The synthetic aperture microwave imaging diagnostic has been operating on the MAST experiment since 2011. It has provided the first 2D images of B-X-O mode conversion windows and showed the feasibility of conducting 2D Doppler back-scattering experiments. The diagnostic heavily relies on field programmable gate arrays to conduct its work. Recent successes and newly gained experience with the diagnostic have led us to modify it. The enhancements will enable pitch angle profile measurements, O and X mode separation, and the continuous acquisition of 2D DBS data. The diagnostic has also been installed on the NSTX-U and is acquiring data since May 2016.