Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source
Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source
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DOI：
10.1063/1.2825426
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发表时间：
2007-12-17
影响因子：
4
通讯作者：
Foerster, E.
中科院分区：
文献类型：
--
作者：
Vine, D. J.;Paganin, D. M.;Foerster, E.
我们已经进行了分析晶体的相位衬度成像（ABI）的实验，使用旋转阳极X射线源。使用这样一个不相干的源演示了ABI作为实验室环境的定量表征工具的潜力。在高分辨率X射线胶片上记录塑料体模的相衬图像，并从单个图像中检索投影厚度。从相衬图像恢复的投影厚度显示为定量地与参考光学显微镜测量一致。(C)2007年，美国物理学会。
We have performed an analyzer crystal based phase contrast imaging (ABI) experiment using a rotating anode x-ray source. The use of such an incoherent source demonstrates the potential of ABI as a quantitative characterization tool for the laboratory environment. A phase contrast image of a plastic phantom was recorded on high resolution x-ray film and the projected thickness was retrieved from a single image. The projected thickness recovered from the phase contrast image was shown to quantitatively agree with a reference optical microscope measurement. (C) 2007 American Institute of Physics.