Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning
Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning
复制标题
木马扫描仪：通过快速 SEM 成像结合图像处理和机器学习来检测硬件木马
DOI：
10.31399/asm.cp.istfa2018p0256
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发表时间：
2018
期刊：
影响因子：
--
通讯作者：
M. Tehranipoor
中科院分区：
文献类型：
--
作者：
Nidish Vashistha;Hangwei Lu;Qihang Shi;M. T. Rahman;Haoting Shen;D. Woodard;Navid Asadizanjani;M. Tehranipoor
硬件木马是在设计和制造过程的不同阶段对集成电路（IC）设计的恶意更改。已经开发了不同的方法来检测特洛伊木马，即非破坏性（电气测试，如运行时监控，功能和结构测试）和破坏性（全芯片逆向工程）。然而，这些方法不能检测所有类型的木马，并且它们遭受许多缺点，例如检测速度慢和在检测所有类型的木马时缺乏信心。大多数在IC中实现的硬件木马将在掺杂（活动）层留下足迹。在本文中，我们介绍了一个新版本的我们以前开发的“木马扫描器”[1]框架的不可信的铸造威胁模型，其中一个可信的GDSII布局（黄金布局）是可用的。先进的计算机视觉算法与监督机器学习模型相结合，用于对来自认证IC的黄金布局和SEM图像的不同特征进行分类，作为每种类型的门的唯一描述符。这些描述符相互比较，以检测活动区域上的任何细微变化，这可以提高潜在硬件木马存在的标志。该描述符可以区分由于制造过程、缺陷和常见SEM图像失真引起的变化，以排除错误检测的可能性。我们的研究结果表明，木马扫描器是更可靠的电气测试和速度比全芯片逆向工程。木马扫描器不依赖于电路的功能，而是专注于真实的物理结构，以检测由不可信的代工厂插入的恶意更改。
Hardware Trojans are malicious changes to the design of integrated circuits (ICs) at different stages of the design and fabrication processes. Different approaches have been developed to detect Trojans namely non-destructive (electrical tests like run-time monitoring, functional and structural tests) and destructive (full chip reverse engineering). However, these methods cannot detect all types of Trojans and they suffer from a number of disadvantages such as slow speed of detection and lack of confidence in detecting all types of Trojans. Majority of hardware Trojans implemented in an IC will leave a footprint at the doping (active) layer. In this paper, we introduce a new version of our previously developed “Trojan Scanner” [1] framework for the untrusted foundry threat model, where a trusted GDSII layout (golden layout) is available. Advanced computer vision algorithms in combination with the supervised machine-learning model are used to classify different features of the golden layout and SEM images from an IC under authentication, as a unique descriptor for each type of gates. These descriptors are compared with each other to detect any subtle changes on the active region, which can raise the flag for the existence of a potential hardware Trojan. The descriptors can differentiate variation due to fabrication process, defects, and common SEM image distortions to rule out the possibility of false detection. Our results demonstrate that Trojan Scanner is more reliable than electrical testing and faster than full chip reverse engineering. Trojan Scanner does not rely on the functionality of the circuit rather focuses on the real physical structure to detect malicious changes inserted by the untrusted foundry.
影响因子：
20.6
作者：
Bhunia, Swarup;Hsiao, Michael S.;Narasimhan, Seetharam
通讯作者：
Narasimhan, Seetharam