Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
复制标题
开发实时散焦图像调制处理电子显微镜。
DOI：
10.1093/oxfordjournals.jmicro.a023760
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发表时间：
1999
期刊：
影响因子：
--
通讯作者：
M. Ichihashi
中科院分区：
文献类型：
--
作者：
Y. Takai;Y. Kimura;T. Ikuta;R. Shimizu;Yuji Sato;S. Isakozawa;M. Ichihashi
一种实时散焦图像调制处理电子显微镜，它利用一个定制设计的，浮动式，加速电压产生系统，以快速和精确地调制焦点，产生无球面像差的相位和振幅图像的时间分辨率为4/30秒。利用非晶薄膜在加速电压调制下的离焦图像构造的通村图的对称图案揭示了球差的真实的实时校正。作为调制的结果，显微镜的分辨率提高到略高于Scherzer极限。利用该电子显微镜在轮廓成像模式下观察到了Au（011）2×1重构表面上原子的动态翻转运动，验证了高压调制系统实时校正的有效性。
A real-time defocus-image modulation processing lectron microscope, which utilizes a custom designed, floating type, accelerating voltage generation system to modulate focus quickly and precisely, produced spherical aberration-free phase and amplitude images with a time resolution of 4/30ths of a second. The symmetric pattern of a Thon diagram, which was constructed by using through-focus images of an amorphous thin film under accelerating voltage modulation, revealed the successful correction of spherical aberration in real time. As a result of the modulation, the resolution of the microscope was improved a little higher than the Scherzer limit. The dynamic flip-flop motion of atoms on a Au (011) 2×1 reconstructed surface was clearly observed in the profile imaging mode by using this novel electron microscope, which demonstrates effectiveness of the developed high voltage modulation system for the real-time correction.