Small correction required when applying the Hertzian contact model to instrumented indentation data
Small correction required when applying the Hertzian contact model to instrumented indentation data
复制标题
将赫兹接触模型应用于仪器化压痕数据时需要进行少量修正
DOI：
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发表时间：
2001
期刊：
影响因子：
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通讯作者：
P. Wolff
中科院分区：
文献类型：
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作者：
J. Hay;P. Wolff
仪器压痕测试（IIT）是一种相对较新的机械测试形式，它大大扩展了传统硬度测试的能力。在IIT实验中，一个已知机械性能的压头被压入接触，然后从测试材料中取出。在IIT实验期间的基本测量是施加的载荷和由此产生的压头在测试表面的渗透。赫兹接触模型或其衍生物通常用于将这些测量与测试材料的有趣机械性能联系起来。本文主张在应用于仪器压痕数据时对赫兹接触模型进行小的修正。修正的大小主要取决于测试材料的泊松比和由压头尖端半径归一化的接触半径。忽略这一修正会导致从仪器压痕数据计算弹性模量和硬度时出现重大误差。
Instrumented indentation testing (IIT) is a relatively new form of mechanical testing which significantly expands on the capabilities of traditional hardness testing. In an IIT experiment, an indenter of known mechanical properties is pressed into contact and then withdrawn from a test material. The fundamental measurements during an IIT experiment are the applied load and the resulting penetration of the indenter into the test surface. The Hertzian contact model, or a derivative thereof, is often employed to relate these measurements to interesting mechanical properties of the test material. This article argues for a small correction to the Hertzian contact model when applied to instrumented indentation data. The magnitude of the correction primarily depends on Poisson’s ratio of the test material and the contact radius normalized by the radius of the indenter tip. Neglecting this correction can cause significant errors in the calculation of elastic modulus and hardness from instrumented indentation data.