Quantitative Atomic Force Microscopy Characterization and Crystal Plasticity Finite Element Modeling of Heterogeneous Deformation in Commercial Purity Titanium
Quantitative Atomic Force Microscopy Characterization and Crystal Plasticity Finite Element Modeling of Heterogeneous Deformation in Commercial Purity Titanium
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DOI：
10.1007/s11661-010-0475-0
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发表时间：
2011-03
期刊：
影响因子：
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通讯作者：
Y. Yang;L. Wang;T. Bieler;P. Eisenlohr;M. Crimp
中科院分区：
文献类型：
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作者：
Y. Yang;L. Wang;T. Bieler;P. Eisenlohr;M. Crimp
使用变形至表面应变约 1.5% 的商业纯钛四点弯曲样品，通过结合原子力显微镜 (AFM)、背散射电子 (BSE) 成像和电子背散射衍射 (EBSD) 的技术，对约 15 个晶粒的微结构斑块中的主动位错滑移和孪生系统进行定量分析。将由 AFM 测量的 z 位移数据得出的局部剪切分布图直接与晶体塑性有限元 (CPFE) 模拟的结果进行比较，该模拟结合了变形过程的唯象模型，以评估 CPFE 模型与实验观察结果相匹配的能力。 CPFE 模型成功地预测了晶粒内大多数类型的主动位错滑移系统，其幅度正确，但晶粒内应变的空间分布在测量和模拟之间存在差异。
Using a four-point bend sample of commercial purity titanium deformed to a surface strain around 1.5 pct, the active dislocation slip and twin systems in a microstructural patch of about 15 grains were quantitatively analyzed by a technique combining atomic force microscopy (AFM), backscattered electron (BSE) imaging, and electron backscattered diffraction (EBSD). Local shear distribution maps derived fromz-displacement data measured by AFM were directly compared to results of a crystal plasticity finite element (CPFE) simulation that incorporates a phenomenological model of the deformation processes to evaluate the ability of the CPFE model to match the experimental observations. The CPFE model successfully predicted most types of active dislocation slip systems within the grains at correct magnitudes, but the spatial distribution of strains within grains differed between the measurements and the simulation.