Laser-diode-stimulated emission depletion microscopy
Laser-diode-stimulated emission depletion microscopy
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DOI：
10.1063/1.1571656
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发表时间：
2003-05-05
影响因子：
4
通讯作者：
Hell, SW
中科院分区：
文献类型：
--
作者：
Westphal, V;Blanca, CM;Hell, SW
We report subdiffraction resolution in far-field fluorescence microscopy through laser-diode-stimulated emission depletion of molecular markers. The diode-generated focal intensities lead to a resolution improvement by similar to45% in both lateral directions. Excitation and stimulated emission are performed with electronically synchronized diode pulses of 50-70 ps and 300-400 ps duration, respectively. The subdiffraction resolution is utilized to resolve neighboring individual molecules. (C) 2003 American Institute of Physics.
