Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever.
Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantilever.
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超纳米晶金刚石尖端集成到加热原子力显微镜悬臂上。
DOI:
10.1088/0957-4484/23/49/495302
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发表时间:
2012
期刊:
影响因子:
3.5
通讯作者:
King,WilliamP
中科院分区:
文献类型:
--
作者:
Kim,HoeJoon;Moldovan,Nicolaie;Felts,JonathanR;Somnath,Suhas;Dai,Zhenting;Jacobs,TevisDB;Carpick,RobertW;Carlisle,JohnA;King,WilliamP
We report a wear-resistant ultrananocrystalline (UNCD) diamond tip integrated onto a heated atomic force microscope (AFM) cantilever and UNCD tips integrated into arrays of heated AFM cantilevers. The UNCD tips are batch-fabricated and have apex radii of approximately 10 nm and heights up to 7 μm. The solid-state heater can reach temperatures above 600 C and is also a resistive temperature sensor. The tips were shown to be wear resistant throughout 1.2 m of scanning on a single-crystal silicon grating at a force of 200 nN and a speed of 10 μm s− 1. Under the same conditions, a silicon tip was completely blunted. We demonstrate the use of these heated cantilevers for thermal imaging in both contact mode and intermittent contact mode, with a vertical imaging resolution of 1.9 nm. The potential application to nanolithography was also demonstrated, as the tip wrote hundreds of polyethylene nanostructures.