FERROMAGNETIC-RESONANCE LINEWIDTH OF FE ULTRATHIN FILMS GROWN ON A BCC CU SUBSTRATE
FERROMAGNETIC-RESONANCE LINEWIDTH OF FE ULTRATHIN FILMS GROWN ON A BCC CU SUBSTRATE
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DOI：
10.1063/1.350110
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发表时间：
1991-11-15
影响因子：
3.2
通讯作者：
HEINRICH, B
中科院分区：
文献类型：
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作者：
CELINSKI, Z;HEINRICH, B
铁磁共振（FMR）线宽Δ H是用于表征薄膜质量的参数。 与频率无关的部分Δ H（0）反映了磁不均匀性的贡献。 线性部分由固有的吉尔伯特阻尼机制引起。 最近，我们发现衬底模板的晶格重构强烈地影响FMR线宽。在未重构的面心立方Ag（001）、面心立方Cu（001）和表面重构的面心立方Cu（001）模板上生长了面心立方Fe（001）膜（约10 ML）。 在未重构的Cu模板上生长的Fe层表现出各向同性的FMR线宽。 相反，在重构Cu模板上生长的Fe层在零频FMR线宽和本征阻尼参数方面表现出各向异性。 其他磁性参数，如单轴和4倍各向异性也进行了讨论。
The ferromagnetic resonance (FMR) linewidth DELTA-H is a parameter used to characterize ultrathin film quality. The frequency-independent part, DELTA-H(0), reflects the contribution of magnetic inhomogeneities. The linear part is caused by the intrinsic Gilbert damping mechanism. Recently we have found that the lattice reconstructions of substrate templates strongly affects the FMR linewidth. bcc Fe(001) films (approximately 10 ML) were grown on unreconstructed fcc Ag(001), bcc Cu(001), and on surface reconstructed bcc Cu(001) templates. Fe layers grown on unreconstructed Cu templates exhibited an isotropic FMR linewidth. Fe layers grown on reconstructed Cu templates, on the contrary, showed an anisotropic behavior in both the zero-frequency FMR linewidth and the intrinsic damping parameter. Other magnetic parameters such as uniaxial and 4-fold anisotropies are also discussed.