Fabrication and characterization of fluorescent rare-earth-doped glass-particle-based tips for near-field optical imaging applications.
Fabrication and characterization of fluorescent rare-earth-doped glass-particle-based tips for near-field optical imaging applications.
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用于近场光学成像应用的荧光稀土掺杂玻璃颗粒尖端的制造和表征。
DOI：
10.1364/ao.43.003829
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发表时间：
2004
期刊：
影响因子：
1.9
通讯作者：
E. Bourhis
中科院分区：
文献类型：
--
作者：
L. Aigouy;Y. De Wilde;M. Mortier;J. Giérak;E. Bourhis
荧光稀土掺杂的玻璃颗粒粘到原子力显微镜的尖端的末端已被用来进行扫描近场光学测量的纳米结构的样品。详细描述了荧光片段在尖端末端的固定过程。该过程包括在尖端上沉积一层薄粘合剂层。然后，对卡在头端末端附近的碎片进行头端入路。为了将颗粒移位并将其定位在尖端的最末端，通过使用安装在压电扫描仪上的第二尖端来实现纳米操纵。之后，通过聚焦离子束研磨减小颗粒尺寸。这些粒子在近红外区通过上转换机制激发时表现出强烈的绿色发光。在金属边缘附近获得的图像显示在180-200 nm范围内的横向分辨率。我们通过测量250纳米孔散射的光获得的图像显示分辨率远低于100纳米。这一现象可以用粒子的局部激发和激发的非线性性质来解释。
Fluorescent rare-earth-doped glass particles glued to the end of an atomic force microscope tip have been used to perform scanning near-field optical measurements on nanostructured samples. The fixation procedure of the fluorescent fragment at the end of the tip is described in detail. The procedure consists of depositing a thin adhesive layer on the tip. Then a tip approach is performed on a fragment that remains stuck near the tip extremity. To displace the particle and position it at the very end of the tip, a nanomanipulation is achieved by use of a second tip mounted on piezoelectric scanners. Afterward, the particle size is reduced by focused ion beam milling. These particles exhibit a strong green luminescence where excited in the near infrared by an upconversion mechanism. Images obtained near a metallic edge show a lateral resolution in the 180-200-nm range. Images we obtained by measuring the light scattered by 250-nm holes show a resolution well below 100 nm. This phenomenon can be explained by a local excitation of the particle and by the nonlinear nature of the excitation.