Fast microscopic method for large scale determination of structure, morphology, and quality of thin colloidal crystals.
Fast microscopic method for large scale determination of structure, morphology, and quality of thin colloidal crystals.
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用于大规模测定薄胶体晶体的结构、形态和质量的快速显微方法。
作者：
H. Schöpe;A. Barreira Fontecha;H. König;J. Marques Hueso;R. Biehl
我们提出了一种新的快速显微镜方法来分析空气干燥或悬浮胶体多层体系的晶体结构。一旦这种薄膜的典型晶格间距在可见光的范围内，观察到特征布拉格散射图案。如果在显微镜观察中，这些被排除在图像构建之外，则会产生用于不同结构、形态和层数的区域的唯一颜色编码。然而，非相干散射缺陷结构可能不被排除在图像构造之外，并且因此以高分辨率保持可见。
We present a novel fast microscopic method to analyze the crystal structures of air-dried or suspended colloidal multilayer systems. Once typical lattice spacings of such films are in the range of visible light, characteristic Bragg scattering patterns are observed. If in microscopic observations these are excluded from image construction, a unique color coding for regions of different structures, morphologies, and layer numbers results. Incoherently scattering defect structures, however, may not be excluded from image construction and thus remain visible with high resolution.