Image enhancement for fluorescence microscopy based on deep learning with prior knowledge of aberration.

Image enhancement for fluorescence microscopy based on deep learning with prior knowledge of aberration.
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基于像差先验知识的深度学习荧光显微镜图像增强。

DOI:
10.1364/ol.418997
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发表时间:
2021-05
期刊:
影响因子:
3.6
通讯作者:
Lejia Hu;Shuwen Hu;W. Gong;Ke Si
Lejia Hu;Shuwen Hu;W. Gong;Ke Si
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Lejia Hu;Shuwen Hu;W. Gong;Ke Si

文献摘要

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在这封信中,我们提出了一种具有潜在畸变先验知识的深度学习方法,以增强荧光显微镜,而无需额外的硬件。该方法能有效地降低噪声,提高采集图像的峰值信噪比,且速度快。在三种商用荧光显微镜上验证了该方法的增强性能和推广性。这项工作提供了一个计算的替代,以克服由生物样品引起的降解,它有可能进一步应用于生物应用。
In this Letter, we propose a deep learning method with prior knowledge of potential aberration to enhance the fluorescence microscopy without additional hardware. The proposed method could effectively reduce noise and improve the peak signal-to-noise ratio of the acquired images at high speed. The enhancement performance and generalization of this method is demonstrated on three commercial fluorescence microscopes. This work provides a computational alternative to overcome the degradation induced by the biological specimen, and it has the potential to be further applied in biological applications.