Ferroelectric property of an epitaxial lead zirconate titanate thin film deposited by a hydrothermal method
Ferroelectric property of an epitaxial lead zirconate titanate thin film deposited by a hydrothermal method
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DOI:
10.1557/proc-784-c11.31
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发表时间:
2004-06
影响因子:
2.7
通讯作者:
T. Morita;Y. Wagatsuma;H. Morioka;H. Funakubo;N. Setter;Yasuo Cho
中科院分区:
文献类型:
--
作者:
T. Morita;Y. Wagatsuma;H. Morioka;H. Funakubo;N. Setter;Yasuo Cho
Deposition of thin films via hydrothermal method has various advantages: low deposition temperature, high purity, deposition on a three-dimensional structure,and a large thickness. Although an epitaxial lead zirconate titanate (PZT) thin-film deposition has been reported, the ferroelectric measurement has not been conducted due to the peel-off morphology of the film. The current paper investigates the improvement of an epitaxial PZT thin film deposited via a hydrothermal method. By adjusting the position at which the substrate was suspended in the solution, smooth morphology surface was successfully obtained. As a bottom electrode, a 200-nm SrRuO_3 thin film was deposited on SrTiO_3 single crystals, and the PZT thin film was deposited on SrRuO_3. The remanent polarization 2 Pr and coercive electric field for PZT on SrRuO_3/SrTiO_3 (001) were 17.1 μC/cm^2 and 36 kV/cm, respectively, and those of PZT on SrRuO_3/SrTiO_3 (111) were 32.7 μC/cm^2 and 59 kV/cm, respectively. The reason for large imprint electrical field, 91 kV/cm and 40 kV/cm for each film, was unclear at this stage, although it is associated with self–alignment poling direction. This self–alignment poling direction was confirmed via scanning nonlinear dielectric microscopy and is thought to have been related to the deposition mechanisms.