Two mode photon bunching effect as witness of quantum criticality in circuit QED
Two mode photon bunching effect as witness of quantum criticality in circuit QED
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双模光子聚束效应作为电路 QED 中量子临界性的见证
DOI：
10.1007/s11433-009-0274-z
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发表时间：
2008-12
期刊：
影响因子：
--
通讯作者：
SUN ChangPu
中科院分区：
文献类型：
--
作者：
AI Qing;LONG GuiLu;WANG YingDan;SUN ChangPu
We suggest a scheme to probe critical phenomena at a quantum phase transition (QPT) using the quantum correlation of two photonic modes simultaneously coupled to a critical system. As an experimentally accessible physical implementation, a circuit QED system is formed by a capacitively coupled Josephson junction qubit array interacting with one superconducting transmission line resonator (TLR). It realizes an Ising chain in the transverse field (ICTF) which interacts with the two magnetic modes propagating in the TLR. We demonstrate that in the vicinity of criticality the originally independent fields tend to display photon bunching effects due to their interaction with the ICTF. Thus, the occurrence of the QPT is reflected by the quantum characteristics of the photonic fields.
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